发明名称 Semiconductor junction antifuse circuit
摘要 An integrated semiconductor junction antifuse is formed from either adjacent regions of opposite doping types or spaced apart regions of similar doping type within a substrate. In its unblown state, the junction antifuse forms an open circuit that blocks current from flowing while in the blown state, the junction antifuse conducts current. The junction antifuse is blown by applying a breakdown voltage sufficient to overcome a semiconductor junction so that current flows across the reverse-biased semiconductor junction. As current flows across the reverse-biased junction, dopant migration forms a conductive path so that the junction antifuse no longer forms an open circuit.
申请公布号 US5973380(A) 申请公布日期 1999.10.26
申请号 US19980206775 申请日期 1998.12.07
申请人 MICRON TECHNOLOGY, INC. 发明人 CUTTER, DOUGLAS J.;BEIGEL, KURT D.
分类号 G11C17/16;G11C17/18;H01L27/105;(IPC1-7):H01L29/86 主分类号 G11C17/16
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