发明名称 |
Temperature-measuring switch for substrate of semiconductor IC chip |
摘要 |
The switch uses the transistor in emitter switching configuration and has an ohmic voltage dividing circuit applied beforehand. The current from a constant current source is divided between the divider and the transistor. The resistance's are produced on the substrates, so that the ratio is independent of temperature. The output voltage over the transistor and the divider is solely dependent on the temperature coefficient of Vbe of the transistor and is multiplied by the inverse of the divider ratio.
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申请公布号 |
DE19914233(A1) |
申请公布日期 |
1999.10.21 |
申请号 |
DE19991014233 |
申请日期 |
1999.03.29 |
申请人 |
NATIONAL SEMICONDUCTOR CORP., SANTA CLARA |
发明人 |
HOANG, TUONG HAI |
分类号 |
G01K7/01;(IPC1-7):G01K7/01 |
主分类号 |
G01K7/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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