发明名称 APPARATUS FOR GAS PROCESSING
摘要 An apparatus for gas processing comprises a showerhead (32) placed immediately under a through window (23) and opposed to a wafer W. The opening area per unit area of gas holes (33) in the showerhead is greater in its outer portions than in its central portions. A gas hole control (34) for opening and closing the gas holes (33) is provided under the showerhead (32). As a result, the surface of a substrate such as a wafer can be uniformly processed by using plasma.
申请公布号 WO9953533(A1) 申请公布日期 1999.10.21
申请号 WO1999JP01902 申请日期 1999.04.09
申请人 TOKYO ELECTRON LIMITED;AMANO, HIDEAKI 发明人 AMANO, HIDEAKI
分类号 H05H1/46;C23C16/452;C23C16/50;C23C16/511;C23F4/00;H01L21/00;H01L21/205;H01L21/302;H01L21/3065;H01L21/31;(IPC1-7):H01L21/205 主分类号 H05H1/46
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