发明名称 MANUFACTURE OF SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory device having an element isolation structure which can improve its electrical isolating property, and also to provide a method for manufacturing the device. SOLUTION: The semiconductor integrated circuit device of an element isolation structure has a semiconductor substrate 1. The substrate has a groove 8b in a region to be later formed as an element isolation region on a diffusion layer 11. The groove is buried with an insulating film 12. In the manufacturing method, a groove is self-alignedly made in the semiconductor substrate with use of a first insulating film formed on a diffusion layer of the semiconductor substrate and a second insulating film 10 formed on an uppermost layer of a gate electrode 9 as masks, and a third insulating film is buried in the groove to thereby forming an element isolation structure.
申请公布号 JPH11289008(A) 申请公布日期 1999.10.19
申请号 JP19980104101 申请日期 1998.03.31
申请人 NEC CORP 发明人 KOTSUKI KAZUTAKA
分类号 H01L21/76;H01L21/8246;H01L27/10;H01L27/112 主分类号 H01L21/76
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