发明名称 |
Method for application of weighted random patterns to partial scan designs |
摘要 |
A method and apparatus for using weighted random patterns in a partial scan test. A computer generates deterministic patterns on the partial scan design. Deterministic patterns that have the same number of capture clocks between adjacent scan loads are grouped together into pattern groups. A computer then determines a set of weights corresponding to each of the pattern groups. A tester then uses these weights as a filter to weighted random test patterns and applies these filtered weighted random test patterns along with the appropriate number of capture clock pulses to a device under test.
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申请公布号 |
US5968194(A) |
申请公布日期 |
1999.10.19 |
申请号 |
US19970831478 |
申请日期 |
1997.03.31 |
申请人 |
INTEL CORPORATION |
发明人 |
WU, DAVID;PARVATHALA, PRAVEEN;GOLLAKOTA, NAGA |
分类号 |
G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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