| 摘要 |
PROBLEM TO BE SOLVED: To automatically diagnose the location and state of a failure on a logic circuit during a stack failure, by comparing the description of a failure diagnosis dictionary formed by failure simulation and a compression value of output series according to the input series impressed while controlling shift pass of a logic circuit to be tested. SOLUTION: A failure simulator 14 simulates in advance the output series when a stack failure (location and state) exists in a logic circuit model 11 on a computer 13 and edits an input series, a compression code and location and state at every failure when a failure does not exist and a compression code of the output series when a failure exists as a failure diagnosis dictionary 16 with a diagnosis dictionary editor 15. Then a tester 17 controls a shift path in the logic circuit to be tested 18 and gives the input series 19, receives the output 20 and compresses, and compares with the compression code contained in the diagnosis dictionary 16. It takes out the location and state 21 of the failure of the correspondent compression code and indicates on a display 22. |
