发明名称 Method for removing silicon nitride material
摘要 A etchant recipe including a mixed gas of one of a CHxFy group and CO gas is used to etch a silicon nitride layer by plasma etching so as to form a thin polymer layer to protect a silicon layer under the silicon nitride layer from over-etching. Then a soft etching is performed to remove the thin polymer. The etchant recipe is, for example, used in forming a contact opening on a gate of a MOS transistor, on which a silicon nitride layer is formed.
申请公布号 US5968846(A) 申请公布日期 1999.10.19
申请号 US19980152379 申请日期 1998.09.14
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHOU, HSIAO-PANG;CHIAO, JUNG-CHAO;HSIUNG, YU-JU
分类号 H01L21/311;(IPC1-7):H01L21/302 主分类号 H01L21/311
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