发明名称 A thin film semiconductor device and method of manufacture.
摘要 <p>A thin film semiconductor circuit layer (1) is formed on a single crystal semiconductor substrate (3) with an oxide film layer (2) between the thin film semiconductor circuit layer 1 and a support substrate (5). The circuit layer and support substrate are stuck together by means of a fluorine containing epoxy family adhesive (4). After this, the single crystal semiconductor substrate (3) is removed. A smoothing layer (6), having silicon dioxide as the main ingredient, may be formed on the thin film semiconductor circuit layer (1). Since neither exfoliation nor destruction of the thin film semiconductor circuit layer happens when removing the single crystal semiconductor substrate, the yield rate in production of thin film semiconductor devices can be greatly improved. &lt;IMAGE&gt;</p>
申请公布号 EP0585125(A2) 申请公布日期 1994.03.02
申请号 EP19930306772 申请日期 1993.08.26
申请人 SEIKO INSTRUMENTS INC. 发明人 MATSUSHITA, KATSUKI;SENBONMATSU, SHIGERU;YAMAZAKI, TSUNEO;IWAKI, TADAO;TAKANO, RYUICHI
分类号 G02F1/136;G02F1/1368;H01L21/02;H01L21/20;H01L21/762;H01L27/12;(IPC1-7):H01L21/20;H01L21/76 主分类号 G02F1/136
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