发明名称 Process for vapor phase epitaxy of compound semiconductor
摘要 A process for forming a high quality epitaxial compound semiconductor layer of indium gallium nitride InxGa1-xN, (where 0<x<1) on a substrate. A first gas including indium trichloride (InCl3) and a second gas including ammonia (NH3) are introduced into a reaction chamber and heated at a first temperature. Indium nitride (InN) is grown epitaxially on the substrate by nitrogen (N2) carrier gas to form an InN buffer layer. Thereafter, a third gas including hydrogen chloride (H1) and gallium (Ga) is introduced with the first and second gases into a chamber heated at a second temperature higher than the first temperature and an epitaxial InxGa1-xN layer is grown on the buffer layer by N2 gas. By using helium, instead of N2, as carrier gas, the InxGa1-xN layer with more homogeneous quality is obtained. In addition, the InN buffer layer is allowed to be modified into a GaN buffer layer.
申请公布号 US5970314(A) 申请公布日期 1999.10.19
申请号 US19970823237 申请日期 1997.03.24
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 OKAHISA, TAKUJI;SHIMAZU, MITSURU;MATSUSHIMA, MASATO;MIURA, YOSHIKI;MOTOKI, KENSAKU;SEKI, HISASHI;KOUKITU, AKINORI
分类号 C30B25/02;C30B29/38;H01L21/205;H01L33/12;H01L33/32;H01L33/34;H01S5/00;H01S5/323;(IPC1-7):H01L21/00;H01L21/20;H01L21/36;C30B25/14 主分类号 C30B25/02
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