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经营范围
发明名称
APPARATUS FOR TESTING INTEGRATED CIRCUIT
摘要
申请公布号
KR100223077(B1)
申请公布日期
1999.10.15
申请号
KR19950038194
申请日期
1995.10.30
申请人
NIPPON ELECTRIC K.K.
发明人
NAKKAIZUMI, KAZUO
分类号
G01R31/28;G01R31/3185;H01L21/66;(IPC1-7):H01L21/66
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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