发明名称 OSCILLATOR CIRCUIT, OCSILLATOR CIRCUIT TESTING METHOD AND TESTING DEVICE THEREFOR
摘要 <p>PROBLEM TO BE SOLVED: To stabilize an oscillation operation by installing a tank circuit, having a resonance frequency which is almost equal to a frequency peculiar to a crystal oscillator between one end of the crystal oscillator and the ground. SOLUTION: A tank circuit 50 is installed, and the resonance frequency of the tank circuit 50 is made to correspond to a frequency peculiar to a crystal oscillator Xta1. Thus, impedance between a crystal oscillator connection terminal XOUT and ground GND is set to be a maximum, and the current flowing from the crystal oscillator connection terminal XOUT to a ground GND-side through a capacitor Cout1 can be reduced. Then, an oscillation operation can be stabilized.</p>
申请公布号 JPH11284439(A) 申请公布日期 1999.10.15
申请号 JP19980080744 申请日期 1998.03.27
申请人 HITACHI LTD;HITACHI TOKYO ELECTRONICS CO LTD 发明人 HIRANO TORU
分类号 G01R31/28;G06F1/04;H03B5/32;(IPC1-7):H03B5/32 主分类号 G01R31/28
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