REPAIR FAULT TESTING CIRCUIT FOR SEMICONDUCTOR MEMORY,申请号KR19960006020-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	REPAIR FAULT TESTING CIRCUIT FOR SEMICONDUCTOR MEMORY
摘要
申请公布号	KR100226262(B1)	申请公布日期	1999.10.15
申请号	KR19960006020	申请日期	1996.03.08
申请人	HYUNDAI ELECTRONICS IND. CO.,LTD	发明人	JUNG, CHUL-WOO;LEE, GHAN-WOO;HONG, SUNG-HEE;CHOI, JONG-GWANG;KIM, YOUNG-SOOK;JUNG, CHUL
分类号	G11C29/00;(IPC1-7):G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

您可能感兴趣的专利

ANTISTATIC COMPOSITION AND MOLDED PRODUCT

ARMREST STRUCTURE FOR VEHICLE, AND SETTING METHOD OF ARMREST HEIGHT FOR VEHICLE

CONTROL SYSTEM OF FOUR-WHEEL DRIVE VEHICLE

DEVICE AND METHOD FOR DETERMINING MOVING METHOD OF ROBOT, AND PROGRAM FOR THE SAME

HIGH-TENSILE THICK STEEL PLATE AND METHOD FOR MANUFACTURING THE SAME

HARD CARBON BLACK

ELECTRONIC ENDOSCOPE SYSTEM

UNIT CONNECTION JOINT

PRINTING METHOD AND PRINTING APPARATUS

METHOD OF FABRICATING INSULATING RESIN MATERIAL

INTERNAL COMBUSTION ENGINE CONTROL DEVICE

CONSTRUCTION METHOD OF PIT-IN TYPE TANK

CUTTING METHOD AND CUTTING DEVICE

HANGING CONTAINER FOR VOLATILIZATION AGENT

STORAGE CABINET

Cr-CONTAINING STEEL PIPE FOR LINE PIPE EXCELLENT IN INTERGRANULAR STRESS CORROSION CRACKING RESISTANCE OF WELD HEAT-AFFECTED ZONE

RANDOM MAT HAVING SUPERIOR DESIGN

TRAVEL DISTANCE MONITORING DEVICE OF ROLLING COMPACTION MACHINE