SEMICONDUCTOR CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To apply an optimum stress conditional voltage and to obtain an efficient cleaning effect by connecting a booster circuit to a power source terminal and connecting an output from a power source selection switch selecting the output voltage of the booster circuit and a test power source to a flash memory EEPROM circuit. SOLUTION: The power source terminal 1 is connected to the booster circuit 2, which boosts the power source to a fixed voltage required for rewriting the flash memory EEPROM 9 to output it. The power source selection switch 7 is connected to the boosted power source 3 and a test power source terminal 4, and selects either one between them by a power source selection control signal 5 to input it to the flash EEPROM 9 as a rewriting power source. When the terminal 4 is selected by the switch 7, the test power source is inputted to the flash EEPROM 9 main body, and the flash EEPROM 9 main body is evaluated easily. Since the path of the booster circuit 2 isn't used, an optional voltage is set in the terminal 4 in an acceleration test to be inputted.