发明名称 BAKING METHOD, MASK SUBSTRATE AND BACKING APPARATUS
摘要 PROBLEM TO BE SOLVED: To accurately transfer a mask pattern by baking so as to avoid the phenomenon that generation of light leaking from a mask substrate differs due to the difference of the polarizing direction of an irradiating light from the opening direction of the mask substrate. SOLUTION: Two linearly polarized parallel light beams 2, 3 may be of a constitution for switching on and off two beams slit from a single optical source, using a shutter, etc., or of two light sources, the parallel light beams 2, 3 are incident on incident planes 4, 5 of an optical block 1, reflecting planes 6, 7 reflect the beams 2, 3 approximately 100% and are mirror-surfaces coated with, e.g. Al, etc., the light beams 2, 3 reflected at the reflective planes 6, 7 are incident on stage planes 8 approximately in the same range, wherein the incident angles of the light beam incident on the stage planes so as to set for the total reflection of the stage planes.
申请公布号 JPH11283911(A) 申请公布日期 1999.10.15
申请号 JP19980098448 申请日期 1998.03.26
申请人 CANON INC 发明人 YAMAMOTO MASAKUNI;NISHIKAWA KOICHIRO
分类号 H01L21/027;G03F1/00;G03F1/68;G03F7/20 主分类号 H01L21/027
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