Measuring current-induced temperature changes in an object enables qualitative and quantitative investigation of electrical properties of object under operating conditions by acquiring high-resolution thermographic object images

摘要

Digitized thermographic images of the same object state are summed until the finishing criterion is satisfied. The method involves causing periodic changes of object temp. between two object states using a switching unit (7) and acquiring two thermographic object images during a temp. change period with a fixed phase angle corresponding to an object state using an infrared camera (2). Digitized images of the same object state are summed until a defined finishing criterion is satisfied, then the difference between two stored values is stored in a difference value memory. The object can be a semiconducting element (13) and the temp. change can be caused by opening and closing an outer circuit (4) containing the element using the switching unit.