发明名称 A semiconductor device having improved protective circuits
摘要 <p>In a semiconductor device, in order to protect an interior of the device, protective circuits are provided. The protective circuits include a first circuit (H11) connected between the first terminal (T1) and a negative potential line, a second circuit (H13) connected between the first terminal (T1) and a ground potential line, and a third circuit (H12) connected between the ground potential line and a second terminal (T2). The first circuit consists of a MOS transistor (H11) having a drain (10) connected with the first terminal (T1), a source (8) connected with the negative potential line, and a gate (9) connected with the first terminal (T1) or the negative potential line. The second circuit consists of a MOS transistor (H13) having a drain (10) connected with the first terminal (T1), a source (19) connected with the ground potential line, and a gate (18) connected with the first terminal (T1) or the ground potential line. The third circuit consists of a MOS transistor (H12) having a drain (13) connected with the second terminal (T2), a source (11) connected with the ground potential line, and a gate (12) connected with the second terminal (T2) or the ground potential line. &lt;IMAGE&gt;</p>
申请公布号 EP0949679(A2) 申请公布日期 1999.10.13
申请号 EP19990302109 申请日期 1999.03.18
申请人 SHARP KABUSHIKI KAISHA 发明人 KAMIMURA, SHINYA
分类号 H01L27/02;H01L27/148;H04N5/335;H04N5/372;H04N5/374;(IPC1-7):H01L27/02 主分类号 H01L27/02
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