发明名称 Floating gate memory cell array allowing cell-by-cell erasure
摘要 A non-volatile semiconductor memory device includes a plurality of memory cells. Each of the plurality of memory cells has a control gate, a source, a drain and a floating gate for storing charges. The floating gate is preferably capacitively coupled to at least one of the source and the drain. The memory device also includes a control circuit for controlling voltages that are respectively applied to the control gate, the source and the drain in order to execute an erasure operation of at least one memory cell in a "memory cell-by-memory cell" format.
申请公布号 US5966332(A) 申请公布日期 1999.10.12
申请号 US19960774255 申请日期 1996.11.27
申请人 SANYO ELECTRIC CO., LTD. 发明人 TAKANO, YOH
分类号 G11C11/56;G11C16/04;G11C16/10;G11C16/14;G11C16/16;(IPC1-7):G11C11/34 主分类号 G11C11/56
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