发明名称 Metal impurity neutralization within semiconductors by fluorination
摘要 Fluorination can be used to neutralize transition metal impurities in Si. Fluorine is incorporated into the near-surface region of Si by implantation or annealing in a fluorine containing ambient. Thermal treatments at appropriate temperatures are used to initiate the interdiffusion and reaction between fluorine and metal contaminants. The impurities readily react with fluorine to form a compound or complex, thus significantly reducing the number of mid-gap impurities.
申请公布号 US5966623(A) 申请公布日期 1999.10.12
申请号 US19960639543 申请日期 1996.04.29
申请人 EASTMAN KODAK COMPANY 发明人 KHOSLA, RAJINDER P.;HUNG, LIANG-SUN
分类号 H01L21/28;H01L21/322;(IPC1-7):H01L21/425 主分类号 H01L21/28
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