发明名称 |
Metal impurity neutralization within semiconductors by fluorination |
摘要 |
Fluorination can be used to neutralize transition metal impurities in Si. Fluorine is incorporated into the near-surface region of Si by implantation or annealing in a fluorine containing ambient. Thermal treatments at appropriate temperatures are used to initiate the interdiffusion and reaction between fluorine and metal contaminants. The impurities readily react with fluorine to form a compound or complex, thus significantly reducing the number of mid-gap impurities.
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申请公布号 |
US5966623(A) |
申请公布日期 |
1999.10.12 |
申请号 |
US19960639543 |
申请日期 |
1996.04.29 |
申请人 |
EASTMAN KODAK COMPANY |
发明人 |
KHOSLA, RAJINDER P.;HUNG, LIANG-SUN |
分类号 |
H01L21/28;H01L21/322;(IPC1-7):H01L21/425 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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