发明名称 Method for removing crevices induced by chemical-mechanical polishing
摘要 A planarizing method involves a first polishing step in which a relatively hard, low compressibility pad removes excess material of a first layer and planarizes the first layer. Deep defects emanating from the polishing surface formed during the first polishing step are then enlarged and filled with a second layer. After filling, and optionally annealing, the second layer is planarized by polishing with a relatively soft and high compressibility pad or by anisotropic etching.
申请公布号 US5965459(A) 申请公布日期 1999.10.12
申请号 US19960729558 申请日期 1996.10.11
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BEYER, KLAUS DIETRICH
分类号 H01L21/3105;(IPC1-7):H01L21/00;H01L21/70 主分类号 H01L21/3105
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