发明名称 X-RAY DIFFRACTION SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To perform correct removal of background independently from an object to be measured by determining the intensity and the intensity level of background, respectively, based on the measurement data of a standard sample and an objective sample. SOLUTION: A background intensity curve stdI (a) is determined from the measurement data of a standard sample and the output intensity level of background is determined from the measurement data of an objective sample. The background intensity I (a) of the measurement data is then determined based on the background intensity curve stdI (a) and the background level of the objective sample. Subsequently, the signal component of the measurement data is determined by subtracting the background intensity curve stdI (a) from the measurement data. According to the X ray diffraction system, correct removal of background can be carried out independently from the object to be measured based on a correct background data.</p>
申请公布号 JPH10339707(A) 申请公布日期 1998.12.22
申请号 JP19970151809 申请日期 1997.06.10
申请人 SHIMADZU CORP 发明人 FUJIWARA TADAYUKI
分类号 G01N23/20;G01J3/28;(IPC1-7):G01N23/20 主分类号 G01N23/20
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