发明名称 Testing computer date-handling capability
摘要 A system for testing computer systems for year 2000 compliance. Test clips 12-14 are connected respectively to the RAM, ROM and real time clock (RTC) of an embedded control system 10. The instructions processed by the control system's microprocessor are sampled from the ROM containing the program code, via test clip 13, by a logic analyser 15. The sampled instructions are recorded in a buffer. The logic analyser selects some of them from the buffer in response to a signal from the test clip 14 indicating the reading of date information from the RTC, or in response to a signal from the test clip 12 indicating the accessing of predetermined memory locations in the RAM which store date information. The selected instructions necessarily contain instructions relating to the manner in which the embedded control system manipulates and stores dates, and can be examined for year 2000 compliance without the need to examine all of the instructions processed by the microprocessor.
申请公布号 AU2944299(A) 申请公布日期 1999.10.11
申请号 AU19990029442 申请日期 1999.03.17
申请人 EMBEDDED SCIENCE LIMITED 发明人 PATRICK HARRISON BOSSERT
分类号 G06F9/44 主分类号 G06F9/44
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