发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, which can readily detect the stress on a semiconductor chip. SOLUTION: This is a semiconductor device, which is formed by mounting a semiconductor chip 1 on a substrate 5. A plurality of distortion detecting elements 3 for detecting the distortion of the semiconductor chip 1 are formed an the specified parts in the semiconductor chip 1 in the same direction. Electric signals are applied on the distortion detecting elements 3. At the same time, an electrode 2 for taking out the output from one distortion detecting element 3 to the outside is formed. On the substrate 5, a measuring terminal 6 for connection to the electrode 2 is formed. The measuring terminal 6 and the electrode 2 are connected.
申请公布号 JPH11274229(A) 申请公布日期 1999.10.08
申请号 JP19980075975 申请日期 1998.03.24
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 TANAKA YASUSHI;KUZUHARA KAZUNARI;INOUE TOMOHIRO
分类号 H01L21/60;H01L29/84;(IPC1-7):H01L21/60 主分类号 H01L21/60
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