| 摘要 |
PROBLEM TO BE SOLVED: To repair an address line that has an electrically defective part in an imaging device with a plurality of common electrode lines nearly in parallel with a plurality of address lines and data lines that exist along the column and row of the array of a plurality of pixels. SOLUTION: In a repairing method, a parallel path 110 for repairing is formed, where the parallel path 110 is provided with a first pixel scanning line segment 120 that is constituted of one portion of a first scanning line 70 being connected to a switching transistor 102 of a first pixel 100, a common electrode line segment 130 that is constituted of one portion of a common electrode line 18 being connected to a light detection element 16 in the first pixel, and a second pixel scanning line segment 140 that is constituted of one portion of a second scanning line 75 that opposes the first scanning line while sandwiching the first pixel. The parallel line for repairing is fused to an address line 7 with an electrically defective part 32 so that the electrical bypass circuit of the electrically defective part can be constituted.
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