发明名称 SEMICONDUCTOR PACKAGE AND METHOD FOR FORMING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor package with high electrical reliability by improving the reliability in electrical connection and strength in mechanical connection between a bump electrode formed at the terminal of a ceramics substrate and the terminal of a resin wiring board, which is capable of preventing poor connection. SOLUTION: For a ceramics/resin composite semiconductor package, a bump electrode 22 is formed at a terminal 21C of a ceramics substrate 21, while the bump electrode 22 provided with an acicular part 22T formed into acute shape. Through hot press-fitting by which the ceramics substrate 21 is laminated to a resin wiring board 24, the acicular part 22T of the bump electrode 22 penetrates a sheet-like adhesive layer 23 and sticks in the terminal 24C of the resin wiring board 24.</p>
申请公布号 JPH11274347(A) 申请公布日期 1999.10.08
申请号 JP19980070679 申请日期 1998.03.19
申请人 TOSHIBA CORP 发明人 NAKAYAMA NORIO;MONMA JUN;YANO KEIICHI
分类号 H05K3/46;H01L21/60;H01L23/10;H01L23/12;H01L23/28;(IPC1-7):H01L23/10 主分类号 H05K3/46
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