发明名称 METHOD AND APPARATUS FOR DISCRIMINATION AND MEASUREMENT OF RADIATION
摘要 <p>PROBLEM TO BE SOLVED: To obtain a method and an apparatus in which every radiation is discriminated from a radiation radiated to, and obtained from, an object, to be measured, when a nondestructive test is made in order to investigate the inside of the object to be measured, in which every discriminated radiation is imaged directly without a time lag so as to be changed into an image, in which the fog of the imaged image is corrected by improving a material constituting a scintillator and its thickness and in which the image of high sensitivity can be obtained. SOLUTION: An apparatus for the discrimination and measurement of a radiation is featured in that an object 4 to be measured, a first scintillator 7, a second scintillator 8 and a third scintillator 9 are arranged in a region to ne irradiated with a radiation radiated from a radiation source, that a beam of light in a first wavelength region is emitted by the first scintillator 7, that a beam of light in a second wavelength region is emitted by the second scintillator 8, that a beam of light in a third wavelength region is emitted by the third scintillator 9, that the beams of light which are emitted by the first, second and third scintillators are recognized according to their wavelengths so as to be corrected, that a measurement according to the kind of every radiation is discriminated according to its wavelength and that the object 4 to be measured is measured simultaneously.</p>
申请公布号 JPH11271453(A) 申请公布日期 1999.10.08
申请号 JP19980098410 申请日期 1998.03.25
申请人 TOSHIBA CORP 发明人 NITSUTO KOICHI;TAKAHARA TAKESHI;FUKUDA KOYO;KONAGAI CHIKARA
分类号 G01T1/00;G01T1/20;G01T7/00;(IPC1-7):G01T1/00 主分类号 G01T1/00
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