发明名称 CONNECTION TEST SYSTEM OF SIGNAL PROCESSOR
摘要 PROBLEM TO BE SOLVED: To reduce a circuit scale without requiring exclusive software by transmitting connection testing loop back cells where a VCI value being intrinsic to a system is set to connected line corresponding parts, permitting the line corresponding parts to return the loop back cells, recognizing the returned loop back cells and extracting the cells. SOLUTION: Respective signal processors 100 and 101 are connected by pair to the line corresponding parts 102 and 103 of an ATM exchange with a redundant configuration. The processors 100 and 101 are provided with means for transmitting the connection testing loop back cells where the VCI value intrinsic to the system is set to the connected line corresponding parts 102 and 103, the parts 102 and 103 return the loop back cells and the signal processors 100 and 101 recognize whether the connection testing loop back cells returned by the line corresponding parts are the self system ones or the other system ones by the VCI value so as to extract the cells.
申请公布号 JPH11275176(A) 申请公布日期 1999.10.08
申请号 JP19980071959 申请日期 1998.03.20
申请人 NEC CORP;NIPPON TELEGR & TELEPH CORP <NTT> 发明人 UENO TOSHIHIRO;MATSUDA TAKAO
分类号 H04L29/14;H04L12/28;H04Q3/00;(IPC1-7):H04L29/14 主分类号 H04L29/14
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