发明名称 ACTIVE MATARIX SUBSTRATE AND ITS INSPECTING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To prevent dielectric breakdown at the intersection part of a preliminary wire and a signal line or scanning line by providing a protecting circuit which connects adjacent preliminary wires. SOLUTION: On an active matrix substrate 1, scanning lines 3 and signal lines 4 are arranged crossing each other and preliminary wires 7 are arranged on the input side and non-input side of the signal lines 4, respectively. Here, a protecting circuit 12 is provided between adjacent preliminary wires 7. Consequently, when a body which is charged electrostatically is brought into contact with a preliminary wire or when some preliminary wire is brought into contact with a grounded body or a body with large capacity while the panel itself is charged electrostatically, the protecting circuit discharges electric charges to other adjacent preliminary wires to avoid the concentration of an electric field on a specific preliminary wire. The resistance value of the protecting circuit is 2 to 400 MΩ.</p>
申请公布号 JPH11271722(A) 申请公布日期 1999.10.08
申请号 JP19980072760 申请日期 1998.03.20
申请人 SHARP CORP 发明人 NAGATA HISASHI;SHIMADA NAOYUKI;TAJIMA YOSHIMITSU
分类号 G01R31/00;G02F1/1333;G02F1/1343;G02F1/136;G02F1/1362;G02F1/1368;(IPC1-7):G02F1/133 主分类号 G01R31/00
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