发明名称 CHARGED PARTICLE BEAM TRANSFER APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a charge particle beam transfer apparatus which can improve the frequency response of a deflector, etc., and to which a structural strength can be given. SOLUTION: A charged particle beam transfer apparatus transfers a pattern on a mask onto a sensitive substrate 21. The transfer device is provided with a projection optical system which forms the image of the pattern on the substrate 21, by projecting a patterned charged particle beam upon the substrate 21 through the mask. The optical system has a vacuum wall 3 which evacuates the passage of the charged particle beam to a vacuum, and a part of it has a thin portion 13 having a thickness of 100-500μm. A bobbin wound with a deflecting coil 11 is stuck to the outside of the thin portion 13, and the wall 3 is made of titanium or a titanium alloy. Therefore, the frequency response of a deflector, etc., can be, improved and at the same time, the structural strength can be given to the transfer device.
申请公布号 JPH11274066(A) 申请公布日期 1999.10.08
申请号 JP19980095188 申请日期 1998.03.25
申请人 NIKON CORP 发明人 NAKASUJI YUZURU
分类号 H01J37/147;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 H01J37/147
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