| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an infrared gas analyzer capable of radiating a light with uniform emission intensity distribution from an infrared light source and absorbing somewhat offset, if occurring on the infrared light source, an infrared detector and a concave reflecting mirror, thereby to perform highly sensitive and highly precise measurement with excellent secular stability. SOLUTION: For an infrared gas analyzer, an infrared light source 13 is provided to be opposed to an elliptical reflecting mirror 11 and an infrared detector 14 is provided at a position or its vicinity where a reflected light flux of infrared light emitted from the infrared light source 13 is focused, whereby gas flows into a space between each of the infrared light source 13 and the infrared detector 14 and the concave reflecting mirror 11. In this case, the infrared light from the infrared light source 13 is emitted to the direction of the concave reflecting mirror 11 via a roughened surface.</p> |
