| 摘要 |
The invention relates to a method for determining the spatial and rotational positions of an object (1). With the assistance of an imaging optical system (5), the object (1) is mapped and detected on a high-sensitivity resolution optoelectronic detector (7). The location parameter of the object (1), such as the position vector (r?0?), the direction vector (v) of the object axis (4), and the angle ( kappa ) of rotation of the object (1) around the object axis (4) is determined from the planar position of the mapped object structures (2a; 2b) in the coordinate system (xDet, yDet) of the detector (7) by means of geometric optical relationships and mathematical evaluation methods. With this, the spatial position of the object (1) is determined in a quick and contactless manner. |
