| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a SPR(surface plasmon resonance angle) detector capable of detecting a resonance angle caused by at least different two-wavelength lights to specify material at a real time or detecting its film thickness and dielectric constant at a real time and doing efficient detecting work. SOLUTION: A metal thin film 35 of required film thickness and dielectric constant is formed on the surface of a glass substrate 33 by using at least different two-wavelength lights with a required angle difference, and the incident angles of the respective lights onto a sensor chip 5 having a prism 19 adhered to the glass substrate 33 on the opposite side of the metal thin film 35 are varied by a variable light radiation device 3. Components of a sample adsorbed to the metal thin film 35 are specified or the film thickness and dielectric constant of the sample are measured, based on a resonance angle wherein the reflectivity of the lights radiated to the sensor chip 5 is minimized.</p> |
