发明名称 |
STRUCTURE FOR PREVENTING PARTICLE FROM BEING GENERATED, BY FLOW OF AIR IN SEMICONDUCTOR FABRICATION APPARATUS |
摘要 |
PURPOSE: A structure is provided to prevent a particle from being generated by the air flow in a semiconductor fabrication apparatus, and particularly a spin scrubber(10) is provided which can prevent the generation of a particle by the air flow occurred in sending a wafer with a sending apparatus and by the flow of air supplied from the external. CONSTITUTION: A structure for preventing the generation of a particle by the flow of air has a number of holes on a frame corresponding to the direction of the air flow. The structure includes an air generation part enabling the air to flow in a fixed direction in the frame of a semiconductor device. The air generation part is arranged inside the frame and is reciprocated within a fixed range inside the frame.
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申请公布号 |
KR20000024753(A) |
申请公布日期 |
2000.05.06 |
申请号 |
KR19980041429 |
申请日期 |
1998.10.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, TAE JIN;KANG, NEUNG SUCK;KWAK, BYUNG HO;KIM, TAE HO |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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