发明名称 STRUCTURE FOR PREVENTING PARTICLE FROM BEING GENERATED, BY FLOW OF AIR IN SEMICONDUCTOR FABRICATION APPARATUS
摘要 PURPOSE: A structure is provided to prevent a particle from being generated by the air flow in a semiconductor fabrication apparatus, and particularly a spin scrubber(10) is provided which can prevent the generation of a particle by the air flow occurred in sending a wafer with a sending apparatus and by the flow of air supplied from the external. CONSTITUTION: A structure for preventing the generation of a particle by the flow of air has a number of holes on a frame corresponding to the direction of the air flow. The structure includes an air generation part enabling the air to flow in a fixed direction in the frame of a semiconductor device. The air generation part is arranged inside the frame and is reciprocated within a fixed range inside the frame.
申请公布号 KR20000024753(A) 申请公布日期 2000.05.06
申请号 KR19980041429 申请日期 1998.10.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, TAE JIN;KANG, NEUNG SUCK;KWAK, BYUNG HO;KIM, TAE HO
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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