发明名称 |
CONTROLLING METHOD OF SEMICONDUCTOR PROCESS USING FEEDBACK |
摘要 |
<p>A method for controlling a semiconductor manufacturing process by failure analysis feedback compares a previous failure analysis result with current real-time process conditions. The method uses the steps of: a) establishing a monitoring data base with abnormal process condition data, the abnormal process condition data being obtained by a correlation between a yield for each manufactured lot and corresponding process conditions for semiconductor equipment when the yield is lowered or semiconductor equipment malfunctions have occurred; b) establishing an equipment data base by obtaining real-time process conditions for on-line semiconductor equipment; c) comparing the real-time process conditions for the on-line semiconductor equipment with the abnormal process conditions of the monitoring data base; and d) stopping the operation of the on-line semiconductor equipment when differences between the real-time and abnormal process conditions fall below a predetermined level.</p> |
申请公布号 |
KR100200480(B1) |
申请公布日期 |
1999.10.01 |
申请号 |
KR19950053372 |
申请日期 |
1995.12.21 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
LEE, MIN-HO |
分类号 |
H01L21/66;G05B15/02;G05B19/418;H01L21/02;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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