发明名称 METHOD AND APPARATUS FOR DETECTING, LOCATING, AND ANALYZING CHEMICAL COMPOUNDS USING SUBATOMIC PARTICLE ACTIVATION (ATOMETRY)
摘要 An apparatus and method for detecting, locating, and analyzing chemical compounds located within a test subject using subatomic particle activation. An excitation source excites a target to simultaneously produce beams each consisting of certain subatomic species, for example fast neutrons and alpha particles. The test subject (and chemical compounds contained therein) is irradiated by the fast neutrons, thereby stimulating the emission of prompt gamma rays. Gamma and alpha detectors are positioned relative to the test subject and target(s) so as to detect the emitted prompt gamma rays and alpha particles in substantial coincidence, and the known physical relationship between the beams is used to spatially locate the activated chemical compound. Energy spectra derived from the gamma detectors are filtered to eliminate all non-relevant spectral artifacts, thereby 1) permitting the creation of a plurality of parallel coincidence channels; 2) reducing the subsequent signal processing required; and 3) increasing the overall accuracy and efficiency of the chemical compound identification and analysis processes. A multi-beam/multi-target embodiment is also disclosed for more accurate spatial location. A method for calibrating and evaluating the efficacy of the system under varying test parameters is further disclosed.
申请公布号 WO9949311(A2) 申请公布日期 1999.09.30
申请号 WO1999US03491 申请日期 1999.02.17
申请人 HIENERGY MICRODEVICES, INC. 发明人 MAGLICH, BOGDAN, C.
分类号 G01N23/221;G01N23/222;G01V5/08;G01V5/14 主分类号 G01N23/221
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