发明名称 METHOD OF INSPECTING A SUBSTRATE FURNISHED WITH A PHOSPHOR LAYER
摘要 A property of a layer of a phosphor screen on a substrate is determined by sending a beam of infrared radiation through the substrate and the layer and measuring, after the passage, the intensity of the beam. The radiation can be measured by a CCD camera.
申请公布号 EP0944811(A1) 申请公布日期 1999.09.29
申请号 EP19980939816 申请日期 1998.09.11
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 GEHRING, FREDERIK, CHRISTIAAN;VAN RIJSEWIJK, LAMBERTUS, JACOBUS, JOSEPH;SCHOLTEN, PIETER;UITTERHOEVE, PETRUS, JOSEPHUS
分类号 G01B11/06;G01N21/00;G01N21/35;H01J9/42;H01J9/50;(IPC1-7):G01B11/06 主分类号 G01B11/06
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