发明名称 Method and apparatus for controlling a temperature of a polishing pad used in planarizing substrates
摘要 A method and apparatus for controlling a polishing characteristic of a polishing pad used in planarization of a substrate. The method preferably includes controlling the temperature of a planarizing surface of the polishing pad so that waste matter accumulations on the planarizing surface soften and/or become more soluble, and/or material comprising the planarizing surface attains approximately its glass transition temperature. The waste matter accumulations and/or a portion of the planarizing surface are in this way softened and more easily removed. The planarizing surface is either heated directly by directing a flow of heated planarizing liquid or heated air to the planarizing surface or indirectly by heating a support surface beneath the polishing pad or by heating the air proximate to the polishing pad.
申请公布号 US5957750(A) 申请公布日期 1999.09.28
申请号 US19970993256 申请日期 1997.12.18
申请人 MICRON TECHNOLOGY, INC. 发明人 BRUNELLI, THAD LEE
分类号 B24B37/04;B24B49/14;B24B53/007;B24B53/013;H01L21/306;(IPC1-7):B24B5/00 主分类号 B24B37/04
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