| 摘要 |
Repair cells for performing metal-only functional repairs in a cell-based circuit layout design are described. The repair cells include a gate array under layer made-up of a group of uncommitted (not interconnected) transistors. A cluster of cells can be placed within the cell-based design in various locations and can be coupled together to form logic function elements. The repair cells can be added to cell-based designs during the metalization processing steps so as to repair/change the cell-based design's function. Furthermore, repair cells can be used as feedthrough cells to facilitate routing in the cell-based circuit layout. In this case, feedthrough cells having gate array underlayers may be arranged in columns or are placed in strategic spots within the layout to facilitate routing.
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