发明名称 Infrared detector array with an elevated thin film
摘要 A novel reticulated array comprises islands of ceramic (e.g. BST 40) which are fabricated from novel materials using unique methods of patterning. A shallow etch stop trench (46) is first ion milled around each ceramic island on front side and then filled with an etch stop material (e.g. parylene 48). An optical coat (e.g transparent metal layer 54, transparent organic layer 56 and conductive metallic layer 58) is elevated above the etch stop material by an elevation layer (e.g. polyimide 49). For some applications, it has been experimentally verified that there is no loss, and sometimes a measured increase, in optical efficiency when the optical coating is not planar in topology. Novel fabrication methods also provide for the convenient electrical and mechanical bonding of each of the massive number of ceramic islands to a signal processor substrate (e.g. Si 86) containing a massive array of sensing circuits.
申请公布号 US5959298(A) 申请公布日期 1999.09.28
申请号 US19960665135 申请日期 1996.06.14
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 BELCHER, JAMES F.;OWEN, ROBERT A.
分类号 H01L27/146;H01L37/02;(IPC1-7):G01J5/54 主分类号 H01L27/146
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