发明名称 |
Semiconductor test apparatus for measuring power supply current of semiconductor device |
摘要 |
A power supply voltage (Vcc) is applied to a dummy capacitor having a capacitance identical to that of a bypass capacitor to generate an excessive current. The excessive current is subtracted from a current flowing through an IC and the bypass capacitor to obtain a power supply current (Icc) of the IC. The time required for measuring power supply current (Icc) of the IC is reduced since it is not necessary to wait for attenuation of the excessive current of the bypass capacitor.
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申请公布号 |
US5959463(A) |
申请公布日期 |
1999.09.28 |
申请号 |
US19970939701 |
申请日期 |
1997.09.29 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA;YAMADA DEN-ON CO., LTD. |
发明人 |
FUNAKURA, TERUHIKO;FUJITA, KAZUYA |
分类号 |
G01R31/26;G01R19/00;G01R31/30;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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