| 摘要 |
PROBLEM TO BE SOLVED: To shorten the test time of a memory cell of a non-volatile memory in a non-volatile memory and a microcomputer incorporating it. SOLUTION: A switching circuit, switching frequency-divided output A1, A2 of a timer counter counting a clock of an internal oscillation circuit 1 and timing signals TIMG1, TIMG2 applied to an external terminal and applying it to a control circuit 3 is provided, and finish of an erasing mode signal ERASE and a writing mode signal PROGRAM is controlled by external timing signals TIMG1 and 2. |
