发明名称 APPARATUS AND METHOD FOR INSPECTION
摘要 PROBLEM TO BE SOLVED: To obtain an apparatus and a method in which the labor of an operator for the fetch from a dictionary of information regarding a component and for the instruction or the like of data for inspection is reduced by a method wherein inspection information which is created by an inspection-information creation means is compared with reference information and the mounting state of the component is judged. SOLUTION: Data which is required for inspecting the mounting state of a component and component image data which expresses the image of the component are stored in a memory for every component. In response to the input of information which specifies a component, the component image data which expresses the component which is specified by its input is read out from the memory, and a component image is displayed on a display device on the basis of the component image data. Reference data regarding the component which is specified by the input is read out from the memory. Reference information regarding the component is created. Inspection information is created on the basis of an image obtained by imaging a component to be inspected. The created inspection information is compared with the reference information. Thereby, the mounting state of the component is judged.
申请公布号 JPH11258176(A) 申请公布日期 1999.09.24
申请号 JP19980082722 申请日期 1998.03.13
申请人 OMRON CORP 发明人 ISHIBANE MASATO
分类号 H05K13/08;G01N21/88;G01N21/93;G01N21/956 主分类号 H05K13/08
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