发明名称 SEMICONDUCTOR DEVICE, AND MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To form a clear mark by raising the mechanical strength of a semiconductor device of such structure that other main face of a semiconductor chip is exposed. SOLUTION: In a semiconductor device 1 of such a structure that other main face of a semiconductor chip 2 where a specified circuit is made in one main face, an external terminal 12 which corresponds to a plurality of electrode pads provided at one main face of the semiconductor chip and is electrically connected to it, a sealing part 14 which covers the pad, and, on the surface of the protective film 4 provided at other main face of the semiconductor chip, a mark 5 are made. Hereby, the mechanical strength of the semiconductor chip can be raised, and the mark recognition in visual inspection can be stabilized.</p>
申请公布号 JPH11260974(A) 申请公布日期 1999.09.24
申请号 JP19980060814 申请日期 1998.03.12
申请人 HITACHI LTD;AKITA DENSHI KK 发明人 SAKURADA SHINICHI
分类号 B23K26/00;H01L23/00;H01L23/28;H01L23/29;H01L23/31;(IPC1-7):H01L23/29 主分类号 B23K26/00
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