发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To restrict local concentration of a metal promoting crystallization of silicon, by a method wherein laser beams are irradiated after a heating process and a region which has specified spin density and is deemed to be a monocrystal in which a grain boundary does not exist substantially is formed. SOLUTION: First, after a nitrogen oxide silicon film 102 is formed as an underlayer on a glass substrate 101, an amorphous silicon film 103 to be a crystalline silicon film is formed. Next, a nickel acetate solution containing a nickel element is coated on a surface of the amorphous silicon film 103. Heating is performed and the amorphous silicon film 103 is crystallized. This heating process is made in the atmosphere containing a halogen element. After the crystalline silicon film is obtained, the reheating process is made in a solution containing halogen at a higher temperature than before. Still further, laser beams are irradiated after the second heating, and a region which has specified spin density of 3×10<17> cm<-3> and is deemed to be a monocrystal in which a grain boundary does not exist substantially is formed.
申请公布号 JPH11261077(A) 申请公布日期 1999.09.24
申请号 JP19980286264 申请日期 1998.10.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;TERAMOTO SATOSHI;KOYAMA JUN;MIYANAGA SHOJI
分类号 H01L21/205;H01L21/02;H01L21/20;H01L21/322;H01L21/336;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/205
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