发明名称 CHARGED PARTICLE ENERGY ANALYSERS
摘要 An electron energy analyser has an electron column (10) to excite a sample (11) on a sample holder (12). Excitation of the sample (11) causes electrons to be emitted, and some of the electrons enter the analyser through an aperture (13), where they are subjected to a substantially hyperbolic field defined with reference to an x-axis and a y-axis, each of which axes is at a substantially constant potential, and which is approximated with a small number of electrodes E1 to E6. The electrons are deflected by the substantially hyperbolic field to impinge upon a detector (14) which is arranged substantially along the x-axis and comprises, for example, a microchannel plate and phosphor screen, in the vicinity of which the electrons are focussed. The electrodes E1 to E5 are arranged in a plane which is inclined to the general axis of the analyser (i.e. the x-axis parallel to the detector (14)), and the electrode E6 is similarly inclined, but in an opposite direction. The prime feature of the electron energy analyser is the ability to detect electrons with a large range of energies, in parallel.
申请公布号 WO9935668(A3) 申请公布日期 1999.09.23
申请号 WO1999GB00009 申请日期 1999.01.12
申请人 UNIVERSITY OF YORK;SHIMADZU RESEARCH LABORATORY (EUROPE) LTD.;PRUTTON, MARTIN;EL GOMATI, MOHAMED, MOCHTAR;JACKA, MARCUS 发明人 PRUTTON, MARTIN;EL GOMATI, MOHAMED, MOCHTAR;JACKA, MARCUS
分类号 H01J49/44;G01N23/225;H01J49/40;H01J49/48 主分类号 H01J49/44
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