发明名称 Irradiating arrangement for charged particles for scanning electron microscope, X-ray microanalysis device, etc.
摘要 The arrangement uses electro-optics to irradiate a sample with a beam of charged particles. A processor controls movement of the stage carrying the object. The device has a sample holder (8), a drive unit for the sample holder, a detector, to measure the sample holder displacement, and an optical unit (1,3-6) to radiate the sample with charged particles (2). An imaging device (22), displays a picture using charged particles or reflected radiation. A display unit (20) displays a marking of each target position in the sample picture that is displayed on the imaging device, and is controlled using an input device (27) and a computer (19). When the sample holder moves, the marking on the display also moves according to the calculated position, and the detected displacement of the sample holder.
申请公布号 DE19911944(A1) 申请公布日期 1999.09.23
申请号 DE19991011944 申请日期 1999.03.17
申请人 HITACHI, LTD. 发明人 KAGEYAMA, KANEO
分类号 H01J37/20;G01N23/225;G01Q30/04;G01Q30/20;H01J37/22;H01J37/252;H01J37/28;H01J37/304;(IPC1-7):H01J37/28;G01N23/04 主分类号 H01J37/20
代理机构 代理人
主权项
地址