发明名称 Floating spring probe pcb test fixture
摘要 A test fixture for a printed circuit board having a pattern of test probes and a fixed probe plate and a top plate adapted for movement toward and away from the probe plate. The probe plate and the top plate have selected patterns of holes for passage of the test probes through the probe plate and the top plate for contacting test points on the printed circuit board which is supported at one end of the test fixture. A probe retention plate is positioned below the top plate in an area of the test probes to prevent the test probes from walking out of the probe plate. The fixture further includes a spacer plate including interface probes to convert the fixture between a wired and a wireless text fixture.
申请公布号 GB2335548(A) 申请公布日期 1999.09.22
申请号 GB19980027487 申请日期 1998.12.15
申请人 * DELAWARE CAPITAL FORMATION INC. 发明人 DAVID R * VAN LOAN;GARY F * ST.ONGE;MARK A * SWART
分类号 G01R1/06;G01R1/073;G01R31/02;G01R31/28;H01L21/66;H05K3/00;(IPC1-7):G01R1/073 主分类号 G01R1/06
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