发明名称 Cleaning processing method of a film forming apparatus
摘要 Disclosed herein is a cleaning processing method in which an object to be processed is mounted on a susceptor in a process chamber of a CVD apparatus, a TiCl4 gas, a H2 gas, and a Ar gas are introduced, a Ti film is formed on a surface of the object to be processed in a region of a plasma generated, the object to be processed is conveyed out of the process chamber, supply of the H2 gas and the Ar gas is thereafter stopped without generating a plasma, and the TiCl4 gas is introduced by means of a carrier gas, to remove unnecessary Ti films sticking to the inside of the film forming apparatus.
申请公布号 US5954887(A) 申请公布日期 1999.09.21
申请号 US19980098987 申请日期 1998.06.17
申请人 TOKYO ELECTRON LIMITED 发明人 HATANO, TATSUO
分类号 C23C16/08;C23C16/44;H01L21/205;H01L21/28;H01L21/285;H01L21/31;(IPC1-7):B08B5/00;B05D3/04 主分类号 C23C16/08
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