发明名称 Method of fabricating a semiconductor integrated circuit having a capacitor with lower electrode comprising titanium nitride
摘要 In order to fabricate a semiconductor device having a stacked capacitor cell, a silicon substrate is first prepared. A lower capacitor electrode having a porous surface is then formed on the silicon substrate. Following this, the lower capacitor electrode is selectively covered with a titanium nitride film. Further, a dielectric film of a material, exhibiting high permittivity or feroelectricity, is deposited on said titanium nitride film, and an upper capacitor electrode is deposited on the dielectric film.
申请公布号 US5956595(A) 申请公布日期 1999.09.21
申请号 US19970892999 申请日期 1997.07.15
申请人 NEC CORPORATION 发明人 ZENKE, MASANOBU
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L27/04
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