发明名称 Semiconductor memory device capable of setting substrate voltage shallow in disturb test mode and self refresh mode
摘要 A switching circuit is provided which activates a shallow level detector and inactivates a deep level detector when a disturb test signal or a self refresh signal is activated. Accordingly, a shallow substrate voltage at the same level as a detection level of the shallow level detector can be generated by a substrate voltage generating circuit not only in a disturb test mode but also in a self refresh mode. As a result, the area penalty due to the shallow level detector is reduced.
申请公布号 US5956281(A) 申请公布日期 1999.09.21
申请号 US19980039270 申请日期 1998.03.16
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 NAKAI, JUN;HAYASHIKOSHI, MASANORI
分类号 G11C11/407;G11C5/14;G11C11/401;G11C11/403;G11C11/408;G11C29/50;(IPC1-7):G11C7/00 主分类号 G11C11/407
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