发明名称 Process for producing multi-level metallization in an integrated circuit
摘要 A method for fabricating a multi-level integrated circuit is disclosed which utilizes a grid pattern from which portions corresponding to the metal layer are selectively removed to form a mask which is subsequently used to deposit dummy features in the open areas between metal lines, thereby to allow the deposition of a substantially planar dielectric surface over the metal layers and dummy features.
申请公布号 US5956618(A) 申请公布日期 1999.09.21
申请号 US19970828155 申请日期 1997.03.27
申请人 LUCENT TECHNOLOGIES INC. 发明人 LIU, CHUN-TING;LEE, KUO-HUA;LIU, RUICHEN
分类号 H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H01L21/027;H01L21/304 主分类号 H01L21/3205
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